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Legacy
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_adc.h
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add external temperature sensor support, separate different test functions, allow to cycle through different test modes
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2025-02-19 19:08:24 +02:00 |
stm32f4xx_hal_adc_ex.h
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add external temperature sensor support, separate different test functions, allow to cycle through different test modes
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2025-02-19 19:08:24 +02:00 |
stm32f4xx_hal_cortex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_def.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_dma.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_dma_ex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_exti.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_flash.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_flash_ex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_flash_ramfunc.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_gpio.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_gpio_ex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_i2c.h
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add PCA9685 testing, add support for one-time run and cleanup functions
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2025-03-08 22:33:55 +02:00 |
stm32f4xx_hal_i2c_ex.h
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add PCA9685 testing, add support for one-time run and cleanup functions
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2025-03-08 22:33:55 +02:00 |
stm32f4xx_hal_i2s.h
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add MP45DT02 testing function
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2025-03-13 19:33:50 +02:00 |
stm32f4xx_hal_i2s_ex.h
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add MP45DT02 testing function
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2025-03-13 19:33:50 +02:00 |
stm32f4xx_hal_pwr.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_pwr_ex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_rcc.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_rcc_ex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_hal_spi.h
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add SST25VF016B Flash testing function
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2025-03-09 16:12:22 +02:00 |
stm32f4xx_hal_tim.h
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add external temperature sensor support, separate different test functions, allow to cycle through different test modes
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2025-02-19 19:08:24 +02:00 |
stm32f4xx_hal_tim_ex.h
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add external temperature sensor support, separate different test functions, allow to cycle through different test modes
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2025-02-19 19:08:24 +02:00 |
stm32f4xx_ll_adc.h
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add external temperature sensor support, separate different test functions, allow to cycle through different test modes
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2025-02-19 19:08:24 +02:00 |
stm32f4xx_ll_bus.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_cortex.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_dma.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_exti.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_gpio.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_i2c.h
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add PCA9685 testing, add support for one-time run and cleanup functions
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2025-03-08 22:33:55 +02:00 |
stm32f4xx_ll_pwr.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_rcc.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_spi.h
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add SST25VF016B Flash testing function
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2025-03-09 16:12:22 +02:00 |
stm32f4xx_ll_system.h
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2025-02-14 23:01:58 +02:00 |
stm32f4xx_ll_tim.h
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add MP45DT02 testing function
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2025-03-13 19:33:50 +02:00 |
stm32f4xx_ll_utils.h
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2025-02-14 23:01:58 +02:00 |