add external temperature sensor support, separate different test functions, allow to cycle through different test modes

This commit is contained in:
2025-02-19 19:08:24 +02:00
parent 7e4820d8ac
commit a2c5b2fe87
24 changed files with 23236 additions and 153 deletions

11
Core/Inc/external_temp.h Normal file
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@@ -0,0 +1,11 @@
#ifndef __EXTERNAL_TEMP
#define __EXTERNAL_TEMP
extern ADC_HandleTypeDef hadc1;
void external_temp_show_celsius(void);
void external_temp_show_fahrenheit(void);
#endif

10
Core/Inc/generic_macros.h Normal file
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@@ -0,0 +1,10 @@
#ifndef __GENERIC_MACROS
#define __GENERIC_MACROS
#define PANIC(status) \
do { \
GPIOD->ODR = status; \
while (1) {} \
} while (0)
#endif

24
Core/Inc/lcd.h Normal file
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@@ -0,0 +1,24 @@
#ifndef __LCD
#define __LCD
#define DISPLAY_RS ((uint16_t) (0x1U << 7))
#define DISPLAY_RW ((uint16_t) (0x1U << 10))
#define DISPLAY_ENA ((uint16_t) (0x1U << 11))
#define DISPLAY_POLL_UNTIL_READY do { while (display_read_status() & 0x80) {} } while (0)
#define DISPLAY_SET_INCREMENT do { display_write_instruction_byte(0x06); } while (0)
#define DISPLAY_SET_DECREMENT do { display_write_instruction_byte(0x04); } while (0)
#define DISPLAY_SET_CURSOR(line, position) do { display_write_instruction_byte(0x80 | (line << 6) | position); } while (0)
#define DISPLAY_CLEAR do { display_write_instruction_byte(0x01); } while (0)
void display_init(void);
uint8_t display_read_status(void);
void display_write_instruction_byte(uint8_t code);
void display_write_data_byte(uint8_t code);
void display_write_data_seq(char *codes);
#endif

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@@ -38,7 +38,7 @@
#define HAL_MODULE_ENABLED
/* #define HAL_CRYP_MODULE_ENABLED */
/* #define HAL_ADC_MODULE_ENABLED */
#define HAL_ADC_MODULE_ENABLED
/* #define HAL_CAN_MODULE_ENABLED */
/* #define HAL_CRC_MODULE_ENABLED */
/* #define HAL_CAN_LEGACY_MODULE_ENABLED */